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 1-11 από 11 αποτελέσματα
1 S. Petrakis, A. Skoulakis, Y. Orphanos, A. Grigoriadis, G. Andrianaki, D. Louloudakis, N. Kortsalioudakis, A. Tsapras, C. Balas, D. Zouridis, E. Pachos, M. Bakarezos, V. Dimitriou, M. Tatarakis, E. P. Benis and N. A. Papadogiannis, “Coherent XUV multispectral diffraction imaging in the microscale,” Appl. Sci., vol. 12, no. 20, Oct. 2022, doi: 10.3390/app122010592.2023-09-13
2 C. Kalogerakis, E. Koutroulis, and M. G. Lagoudakis, “Global MPPT based on machine-learning for PV arrays operating under partial shading conditions,” Appl. Sci., vol. 10, no. 2, Jan. 2020. doi: 10.3390/app100207002021-09-27
3 N. Makris, M. Bucher, L. Chevas, F. Jazaeri and J.-M. Sallese, “Free carrier mobility, series resistance, and threshold voltage extraction in junction FETs,” IEEE Trans. Electron Devices, vol. 67, no. 11, pp. 4658–4661, Nov. 2020. doi: 10.1109/TED.2020.30258412021-04-09
4 M. Bucher, N. Makris and L. Chevas, “Generalized constant current method for determining MOSFET threshold voltage”, IEEE Trans. Electron Devices, vol. 67, no. 11, pp. 4559–4562, Nov. 2020. doi: 10.1109/TED.2020.30190192021-04-08
5 N. Makris, M. Bucher, F. Jazaeri and J.-M. Sallese, "CJM: a compact model for double-gate junction FETs," IEEE J. Electron Devices Soc., vol. 7, pp. 1191-1199, Oct. 2019. doi: 10.1109/JEDS.2019.29448172020-10-29
6 N. Makris, K. Zekentes and M. Bucher, “Compact modeling of SiC and GaN junction FETs at high temperature,” Mater. Sci. Forum, vol. 963, pp. 683–687, Jul. 2019. https://doi.org/10.4028/www.scientific.net/msf.963.6832020-10-27
7 I. Vourlaki, C. Balas, G. Livanos, M. Vardoulakis, G. Giakos and M. Zervakis, "Bootstrap clustering approaches for organization of data: application in improving grade separability in cervical neoplasia," Biomed. Signal Process. Control, vol. 49, pp. 263-273, Mar. 2019. doi: 10.1016/j.bspc.2018.12.0142020-07-27
8 C. Balas, G. Epitropou, A. Tsapras and N. Hadjinicolaou, "Hyperspectral imaging and spectral classification for pigment identification and mapping in paintings by El Greco and his workshop," Multimed. Tools Appl., vol. 77, no. 8, pp. 9737-9751, Apr. 2018. doi: 10.1007/s11042-017-5564-22019-09-19
9 N. Makris, F. Jazaeri, J.-M. Sallese, R.K. Sharma and M. Bucher, "Charge-based modeling of long-channel symmetric double-gate junction FETs-Part I: drain current and transconductances," IEEE Trans. Electron Devices, vol. 65, no. 7, pp. 2744-2750, Jul. 2018. doi: 10.1109/TED.2018.28381012019-09-03
10 F. Jazaeri, N. Makris, A. Saeidi. M. Bucher and J.-M. Sallese, "Charge-based model for junction FETs," IEEE Trans. Electron Devices, vol. 65, no. 7, pp. 2694-2698, July 2018. doi: 10.1109/TED.2018.28309722019-09-02
11 N. Makris, F. Jazaeri, J.-M. Sallese and M. Bucher, "Charge-based modeling of long-channel symmetric double-gate junction FETs-Part II: total charges and transcapacitances," IEEE Trans. Electron Devices, vol. 65, no. 7, pp. 2751-2756, July 2018. doi: 10.1109/TED.2018.28380902019-09-02