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	1-7 από 7 αποτελέσματα
1	A. Papadopoulou, N. Makris, L. Chevas, A. Nikolaou and M. Bucher, "Design of micropower operational transconductance amplifiers for high total ionizing dose effects," in 8th International Conference on Modern Circuits and Systems Technologies, 2019. doi: 10.1109/MOCAST.2019.8742031	2020-06-10
2	A. Nikolaou, L. Chevas, A. Papadopoulou, N. Makris, M. Bucher, G. Borghello and F. Faccio, "Forward and reverse operation of enclosed-gate MOSFETs and sensitivity to high total ionizing dose," in 26th International Conference "Mixed Design of Integrated Circuits and Systems", 2019, pp. 306-309. doi: 10.23919/MIXDES.2019.8787098	2020-06-05
3	W. Grabinski, M. Pavanello, M. De Souza, D. Tomaszewski, J. Malesinska, G. Guszko, M. Bucher, N. Makris, A. Nikolaou, A. Abo-Elhadid, M. Mierzwinski, L. Lemaitre, M. Brinson, C. Lallement, J.-M. Sallese, S. Yoshitomi, P. Malisse, H. Oguey, S. Cserveny, C. Enz and F. Krummenacher, "FOSS EKV2.6 Verilog-A compact MOSFET model," in 49th European Solid-State Device Research Conference, 2019, pp. 190-193. doi: 10.1109/ESSDERC.2019.8901822	2020-04-30
4	N. Makris, L. Chevas and M. Bucher, "Compact modeling of low frequency noise and thermal noise in junction field effect transistors," in 49th European Solid-State Device Research Conference, 2019, pp. 198-201. doi: 10.1109/ESSDERC.2019.8901775	2020-04-23
5	A. Boubaris, N. Rigogiannis, Z. Agorastou, N. Papanikolaou, S. Siskos and E. Koutroulis, "Analysis, design and simulation of an on-chip DC/DC/AC conversion system for PV applications," in 5th Panhellenic Conference on Electronics and Telecommunications, Nov. 2019. doi: 10.1109/PACET48583.2019.8956293	2020-04-07
6	A. Nikolaou, M. Bucher, N. Makris, A. Papadopoulou, L. Chevas, G. Borghello, H.D. Koch, K. Kloukinas, T.S. Poikela and F. Faccio, "Extending a 65nm CMOS process design kit for high total ionizing dose effects," in 7th International Conference on Modern Circuits and Systems Technologies, 2018, pp. 1-4. doi: 10.1109/MOCAST.2018.8376561	2019-09-06
7	M. Bucher, A. Nikolaou, A. Papadopoulou, N. Makris, L. Chevas, G. Borghello, H.D. Koch and F. Faccio, "Total ionizing dose effects on analog performance of 65 nm bulk CMOS with enclosed-gate and standard layout," in IEEE International Conference on Microelectronic Test Structures, 2018, pp. 166-170. doi: 10.1109/ICMTS.2018.8383790	2019-09-06