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Statistical analysis of low frequency noise in Enclosed Gate MOSFETs

Nikolaou Aristeidis

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URI: http://purl.tuc.gr/dl/dias/C430AFDB-1CC3-4699-A38D-14E806CF17E7
Year 2016
Type of Item Diploma Work
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Bibliographic Citation Aristeidis Nikolaou, "Statistical analysis of low frequency noise in Enclosed Gate MOSFETs", Diploma Work, School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece, 2016 https://doi.org/10.26233/heallink.tuc.66251
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Diploma Works in Community School of Electrical and Computer Engineering

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