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Results

	1-4 from 4 Results - Acović, Alexandre
1	M. Bucher, A. Nikolaou, N. Mavredakis, N. Makris, M. Coustans, J. Lolivier, P. Habas, A. Acovic and R. Meyer, "Variability of low frequency noise and mismatch in enclosed-gate and standard nMOSFETs" in International Conference on Microelectronic Test Structures, 2017. doi: 10.1109/ICMTS.2017.7954285	2018-05-08
2	N. Mavredakis, M. Bucher, P. Habas, A. Acovic and R. Meyer, "Statistical compact modeling of low frequency noise in buried-channel, native, and standard MOSFETs," in International Conference on Noise and Fluctuations, 2017. doi: 10.1109/ICNF.2017.7985942	2018-04-25
3	M. Coustans, F. Jazaeri, C. Enz, F. Krummenacher, M. Kayal, R. Meyer, A. Acovic, P. Habaš, J. Lolivier and M. Bucher, "Variability of low frequency noise and mismatch in CORNER DOPED and standard CMOS technology," in International Conference on Noise and Fluctuations, 2017. doi : 10.1109/ICNF.2017.7985953	2018-04-25
4	A. Nikolaou, N. Mavredakis, M. Bucher, P. Habas, A. Acovic and R. Meyer, "Statistical analysis of 1/f noise in enclosed-gate N- and PMOS transistors," in International Conference on Noise and Fluctuations, 2017. doi : 10.1109/ICNF.2017.7986018	2018-04-25