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Results
1-2 from 2 Results -
Analog parameter
1
M. Bucher, A. Nikolaou, A. Papadopoulou, N. Makris, L. Chevas, G. Borghello, H.D. Koch and F. Faccio, "Total ionizing dose effects on analog performance of 65 nm bulk CMOS with enclosed-gate and standard layout," in IEEE International Conference on Microelectronic Test Structures, 2018, pp. 166-170. doi: 10.1109/ICMTS.2018.8383790
2019-09-06
2
L. Chevas, A. Nikolaou, M. Bucher, N. Makris, A. Papadopoulou, A. Zografos, G. Borghello, H. D. Koch and E. Faccio, "Investigation of scaling and temperature effects in total ionizing dose (TID) experiments in 65 nm CMOS" in 25th International Conference "Mixed Design of Integrated Circuits and Systems", 2018, pp. 313-318. doi: 10.23919/MIXDES.2018.8436809
2019-06-19