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	1-1 from 1 Results - Ge(In) semiconductor
1	N. Kallithrakas-Kontos and A.A. Katsanos, "Efficiency calibration of a Ge(In) semiconductor detector by thin- and thick-arget PIXE" X-Ray Spectrom., vol. 23, no. 2, pp. 96-99, Mar.-Aprl. 1994. doi: 10.1002/xrs.1300230211	2015-10-12