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	1-8 από 8 αποτελέσματα
1	L. Chevas, N. Makris, M. Kayambaki, A. Kostopoulos, A. Stavrinidis, G. Konstantinidis, and M. Bucher, "A contribution to GaN HEMT modeling and parameter extraction including temperature dependence," in Proceedings of the 2022 IEEE Latin American Electron Devices Conference (LAEDC 2022), Cancun, Mexico, 2022, doi: 10.1109/LAEDC54796.2022.9908184.	2024-08-02
2	A. Papadopoulou, N. Makris, L. Chevas, A. Nikolaou and M. Bucher, "Design of micropower operational transconductance amplifiers for high total ionizing dose effects," in 8th International Conference on Modern Circuits and Systems Technologies, 2019. doi: 10.1109/MOCAST.2019.8742031	2020-06-10
3	A. Nikolaou, L. Chevas, A. Papadopoulou, N. Makris, M. Bucher, G. Borghello and F. Faccio, "Forward and reverse operation of enclosed-gate MOSFETs and sensitivity to high total ionizing dose," in 26th International Conference "Mixed Design of Integrated Circuits and Systems", 2019, pp. 306-309. doi: 10.23919/MIXDES.2019.8787098	2020-06-05
4	W. Grabinski, M. Pavanello, M. De Souza, D. Tomaszewski, J. Malesinska, G. Guszko, M. Bucher, N. Makris, A. Nikolaou, A. Abo-Elhadid, M. Mierzwinski, L. Lemaitre, M. Brinson, C. Lallement, J.-M. Sallese, S. Yoshitomi, P. Malisse, H. Oguey, S. Cserveny, C. Enz and F. Krummenacher, "FOSS EKV2.6 Verilog-A compact MOSFET model," in 49th European Solid-State Device Research Conference, 2019, pp. 190-193. doi: 10.1109/ESSDERC.2019.8901822	2020-04-30
5	N. Makris, L. Chevas and M. Bucher, "Compact modeling of low frequency noise and thermal noise in junction field effect transistors," in 49th European Solid-State Device Research Conference, 2019, pp. 198-201. doi: 10.1109/ESSDERC.2019.8901775	2020-04-23
6	A. Boubaris, N. Rigogiannis, Z. Agorastou, N. Papanikolaou, S. Siskos and E. Koutroulis, "Analysis, design and simulation of an on-chip DC/DC/AC conversion system for PV applications," in 5th Panhellenic Conference on Electronics and Telecommunications, Nov. 2019. doi: 10.1109/PACET48583.2019.8956293	2020-04-07
7	A. Nikolaou, M. Bucher, N. Makris, A. Papadopoulou, L. Chevas, G. Borghello, H.D. Koch, K. Kloukinas, T.S. Poikela and F. Faccio, "Extending a 65nm CMOS process design kit for high total ionizing dose effects," in 7th International Conference on Modern Circuits and Systems Technologies, 2018, pp. 1-4. doi: 10.1109/MOCAST.2018.8376561	2019-09-06
8	M. Bucher, A. Nikolaou, A. Papadopoulou, N. Makris, L. Chevas, G. Borghello, H.D. Koch and F. Faccio, "Total ionizing dose effects on analog performance of 65 nm bulk CMOS with enclosed-gate and standard layout," in IEEE International Conference on Microelectronic Test Structures, 2018, pp. 166-170. doi: 10.1109/ICMTS.2018.8383790	2019-09-06