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Chromium speciation by TXRF analysis

Kallithrakas-Kontos Nikolaos, Koulouridakis Pavlos, Χατζησταύρος Βασίλειος, Αρετάκη Ιωάννα

Απλή Εγγραφή


URIhttp://purl.tuc.gr/dl/dias/A15D8045-CA82-465A-A7DF-2B761168C568-
Αναγνωριστικόhttps://doi.org/10.1002/xrs.1141-
Αναγνωριστικόhttps://onlinelibrary.wiley.com/doi/abs/10.1002/xrs.1141-
Γλώσσαen-
Μέγεθος5 pagesen
ΤίτλοςChromium speciation by TXRF analysisen
ΔημιουργόςKallithrakas-Kontos Nikolaosen
ΔημιουργόςΚαλλιθρακας-Κοντος Νικολαοςel
ΔημιουργόςKoulouridakis Pavlosen
ΔημιουργόςΚουλουριδακης Παυλοςel
ΔημιουργόςΧατζησταύρος Βασίλειοςel
ΔημιουργόςHatzistavros Vasiliosen
ΔημιουργόςΑρετάκη Ιωάνναel
ΔημιουργόςAretaki Ioannaen
ΕκδότηςJohn Wiley and Sonsen
ΠερίληψηChromium (Cr) is an element which usually occurs in two different forms, Cr(III) and Cr(VI). As Cr(VI) is much more toxic than Cr(III), no complicated analytical methods with low detection limit are needed for chromium speciation. In the present work, a new method is presented for chromium speciation at low concentrations by selective membrane collection and total Reflection x-ray fluorescence (TXRF) analysis. Various membranes were produced on the surface of quartz reflectors containing different complexing ligands in Nafion and poly vinyl chloride (PVC) matrices. The membranes were produced on the surface of quartz glass, while the reflectors were immersed in water solutions with low concentrations of chromium salts for many hours. When the equilibration stage was achieved, the reflectors were analyzed by TXRF. Completely selective membranes for Cr(III) and Cr(VI) were prepared with minimum detection limits lower than 0.6 ng.ml−1 (ppb) in drinking wateren
ΤύποςPeer-Reviewed Journal Publicationen
ΤύποςΔημοσίευση σε Περιοδικό με Κριτέςel
Άδεια Χρήσηςhttp://creativecommons.org/licenses/by/4.0/en
Ημερομηνία2015-10-07-
Ημερομηνία Δημοσίευσης2009-
Θεματική ΚατηγορίαChromiumen
Θεματική ΚατηγορίαTXRF analysisen
Βιβλιογραφική ΑναφοράN. Kallithrakas-Kontos, P. Koulouridakis, V. Hatzistavros and I. N. Aretaki, "Chromium speciation by TXRF analysis," X-Ray Spectrom., vol. 38, no. 2, pp. 152–156, Jan. 2009. doi:10.1002/xrs.1141en

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