Ιδρυματικό Αποθετήριο
Πολυτεχνείο Κρήτης
Πολυτεχνείο Κρήτης
EN
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| URI: | http://purl.tuc.gr/dl/dias/B6FA5D06-0164-4769-AF95-F182CC61DF27 | ||
| Έτος | 2002 | ||
| Τύπος | Δημοσίευση σε Περιοδικό με Κριτές | ||
| Άδεια Χρήσης |
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| Βιβλιογραφική Αναφορά | A. G. Karydas, S. Galanopoulos, Ch. Zarkadas, T. Paradellis and N. Kallithrakas-Kontos, "Chemical state speciation by resonant Raman scattering", J. Phys. Condens. Matter, vol. 14, no. 47, pp. 12367-12381, Nov. 2002. doi: 10.1088/0953-8984/14/47/311 https://doi.org/10.1088/0953-8984/14/47/311 | ||
| Εμφανίζεται στις Συλλογές |
In the resonant Raman scattering (RRS) process the emitted photon exhibits a continuous energy distribution with a high energy cutoff limit. This cutoff energy depends on the chemical state of the element under examination. In the present work, the possibility of identifying the chemical state of V atoms by employing RRS spectroscopy with a semiconductor Si(Li) detector is investigated. A proton induced Cr Kα x-ray beam was used as the incident radiation, having a fixed energy lower than the V K-absorption edge. The net RRS distributions extracted from the energy dispersive spectra of metallic V and its compound targets were simulated by an appropriate theoretical model. The results showed the possibility of employing RRS spectroscopy with a semiconductor detector for chemical speciation studies.
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