| URI | http://purl.tuc.gr/dl/dias/B6FA5D06-0164-4769-AF95-F182CC61DF27 | - | 
| Identifier | https://doi.org/10.1088/0953-8984/14/47/311 | - | 
| Identifier | http://iopscience.iop.org/article/10.1088/0953-8984/14/47/311 | - | 
| Language | en | - | 
| Extent | 14 pages | en | 
| Title | Chemical state speciation by resonant Raman scattering | en | 
| Creator | Karydas, A.G | en | 
| Creator | Galanopoulos S. | en | 
| Creator | Zarkadas, Ch | en | 
| Creator | Kallithrakas-Kontos Nikolaos | en | 
| Creator | Καλλιθρακας-Κοντος Νικολαος | el | 
| Creator | Paradellis, T | en | 
| Publisher | IOP Publishing | en | 
| Description | Δημοσίευση σε επιστημονικό περιοδικό  | el | 
| Content Summary | In the resonant Raman scattering (RRS) process the emitted photon exhibits a continuous energy distribution with a high energy cutoff limit. This cutoff energy depends on the chemical state of the element under examination. In the present work, the possibility of identifying the chemical state of V atoms by employing RRS spectroscopy with a semiconductor Si(Li) detector is investigated. A proton induced Cr Kα x-ray beam was used as the incident radiation, having a fixed energy lower than the V K-absorption edge. The net RRS distributions extracted from the energy dispersive spectra of metallic V and its compound targets were simulated by an appropriate theoretical model. The results showed the possibility of employing RRS spectroscopy with a semiconductor detector for chemical speciation studies. | el | 
| Type of Item | Peer-Reviewed Journal Publication | en | 
| Type of Item | Δημοσίευση σε Περιοδικό με Κριτές | el | 
| License | http://creativecommons.org/licenses/by/4.0/ | en | 
| Date of Item | 2015-10-09 | - | 
| Date of Publication | 2002 | - | 
| Subject |  Raman scattering | en | 
| Subject | RRS spectroscopy | en | 
| Bibliographic Citation | A. G. Karydas, S. Galanopoulos, Ch. Zarkadas, T. Paradellis and N. Kallithrakas-Kontos, "Chemical state speciation by resonant Raman scattering", J. Phys. Condens. Matter, vol. 14, no. 47, pp. 12367-12381, Nov. 2002. doi: 10.1088/0953-8984/14/47/311 | en |