Ιδρυματικό Αποθετήριο
Πολυτεχνείο Κρήτης
Πολυτεχνείο Κρήτης
EN
|
EL
| URI | http://purl.tuc.gr/dl/dias/47D15063-4A0C-4C41-B524-8C14FBE9039F | - |
| Αναγνωριστικό | https://onlinelibrary.wiley.com/doi/abs/10.1002/%28SICI%291097-4539%28199805/06%2927%3A3%3C173%3A%3AAID-XRS266%3E3.0.CO%3B2-P | - |
| Αναγνωριστικό | https://doi.org/10.1002/(SICI)1097-4539(199805/06)27:3<173::AID-XRS266>3.0.CO;2-P | - |
| Γλώσσα | en | - |
| Μέγεθος | 4 pages | en |
| Τίτλος | Vanadium speciation by EDXRF | en |
| Δημιουργός | Kallithrakas-Kontos Nikolaos | en |
| Δημιουργός | Καλλιθρακας-Κοντος Νικολαος | el |
| Δημιουργός | Moshohoritou R. | en |
| Εκδότης | John Wiley and Sons | en |
| Περιγραφή | Δημοσίευση σε επιστημονικό περιοδικό | el |
| Περίληψη | Elemental chemical speciation by measuring x-ray energy shifts has been carried out by various authors in the past, using tube excitation and wavelength detection. Among the most intense determined shifts are those of vanadium compounds; further, vanadium speciation determination seems to be even more important than total element analysis. In this work, the possibility of vanadium compound speciation by measuring K x-ray line energy shifts was studied by using radioactive source excitation and detection by an energy-dispersive Si(Li) detector of moderate resolution. The effect of the fitting parameters to the results was examined for the K–L2,3 and K–M2,3 lines, and the results are compared with previous data obtained by wavelength-dispersive x-ray fluorescence. | en |
| Τύπος | Peer-Reviewed Journal Publication | en |
| Τύπος | Δημοσίευση σε Περιοδικό με Κριτές | el |
| Άδεια Χρήσης | http://creativecommons.org/licenses/by/4.0/ | en |
| Ημερομηνία | 2015-10-10 | - |
| Ημερομηνία Δημοσίευσης | 1998 | - |
| Θεματική Κατηγορία | Vanadium speciation | en |
| Θεματική Κατηγορία | Radioactive source excitation | en |
| Θεματική Κατηγορία | Energy-dispersive Si(Li) | en |
| Βιβλιογραφική Αναφορά | N. Kallithrakas-Kontos and R. Moshohoritou, "Vanadium speciation by EDXRF," X‐Ray Spectrom., vol. 27, no. 3, pp. 173-176, Jun. 1998. doi: 10.1002/(SICI)1097-4539(199805/06)27:3<173::AID-XRS266>3.0.CO;2-P | en |
Copyright © DIAS 2013
