Ιδρυματικό Αποθετήριο
Πολυτεχνείο Κρήτης
Πολυτεχνείο Κρήτης
EN
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| URI: | http://purl.tuc.gr/dl/dias/737BDAFB-9298-4074-9D47-ACB027B0C038 | ||
| Έτος | 1994 | ||
| Τύπος | Δημοσίευση σε Περιοδικό με Κριτές | ||
| Άδεια Χρήσης |
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| Βιβλιογραφική Αναφορά | N. Kallithrakas-Kontos and A.A. Katsanos, "Efficiency calibration of a Ge(In) semiconductor detector by thin- and thick-arget PIXE" X-Ray Spectrom., vol. 23, no. 2, pp. 96-99, Mar.-Aprl. 1994. doi: 10.1002/xrs.1300230211 https://doi.org/10.1002/xrs.1300230211 | ||
| Εμφανίζεται στις Συλλογές |
The efficiency of a Ge(In) semiconductor x-ray detector was measured in the energy region 1‒25 keV using proton-induced x-rays from thick targets and from thin targets of standard thickness, and the results of the two calibration methods were compared. A proton energy of 2.00 MeV was used in an external beam facility. A model based on fundamental parameters (mass absorption coefficients, fluorescence yields and relative x-ray emission rates) was used to reproduce the experimental results.
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