Ιδρυματικό Αποθετήριο
Πολυτεχνείο Κρήτης
Πολυτεχνείο Κρήτης
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| URI: | http://purl.tuc.gr/dl/dias/5D69158C-E88E-4DE8-9D50-5BEA5599ED0B | ||
| Έτος | 1988 | ||
| Τύπος | Δημοσίευση σε Περιοδικό με Κριτές | ||
| Άδεια Χρήσης |
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| Βιβλιογραφική Αναφορά | A. A. Katsanos, A. Aravantinos and N. Kallithrakas-Kontos, "Thick target X-ray yields from proton bombardment," X‐Ray Spectrom., vol. 17, no. 1, pp. 13–16, Feb. 1988. doi: 10.1002/xrs.1300170104 https://doi.org/10.1002/xrs.1300170104 | ||
| Εμφανίζεται στις Συλλογές |
The production yields for characteristic x-rays from the bombardment of thick targets by protons are calculated by integrating the x-ray production cross-section for each element for the whole range of the protons, taking into account the self-absorption of x-rays. A simple approximation which can be applied with a pocket calculator is also presented, using simplified relationships for the energy dependence of the proton stopping power and the x-ray production cross-sections. The approximation allows very fast calculations, has an accuracy of better than 5% for low-energy protons and is also very useful for the first steps in a computer program for PIXE analysis of thick targets, using the method of iterations. The calculated yields are compared with experimental results obtained on thick specimens of pure elements, compounds and standards.
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