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In vivo dynamic imaging, in silico modeling and global sensitivity analysis for the study and the diagnosis of epithelial neoplasia

Balas Costas, Papoutsoglou Georgios, Anastasopoulou Angeliki, Stavrakakis Georgios, W.P. Soutter

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URIhttp://purl.tuc.gr/dl/dias/B30F7A58-E40E-45D7-A508-C1EC4C018543-
Identifierhttps://doi.org/10.1109/IEMBS.2011.6089905-
Languageen-
TitleIn vivo dynamic imaging, in silico modeling and global sensitivity analysis for the study and the diagnosis of epithelial neoplasiaen
CreatorBalas Costasen
CreatorΜπαλας Κωσταςel
CreatorPapoutsoglou Georgiosen
CreatorΠαπουτσογλου Γεωργιοςel
CreatorAnastasopoulou Angelikien
CreatorΑναστασοπουλου Αγγελικηel
CreatorStavrakakis Georgiosen
CreatorΣταυρακακης Γεωργιοςel
CreatorW.P. Soutteren
PublisherInstitute of Electrical and Electronics Engineersen
Content SummaryWe present a method for detecting and studying neoplasia-specific functional and structural features through the combination of in vivo dynamic imaging, in silico modeling and global sensitivity analysis. We particularly present the case of cervical epithelium interacting with acetic acid solution, which is employed as an optical biomarker. The in vivo measured dynamic scattering characteristics are strongly correlated with the output of the biomarker's pharmacokinetic model that we have developed. Model global sensitivity analysis has shown that the measured/modeled bio-optical processes can be used for probing, in vivo, the number of neoplastic layers, the extracellular pH, the intracellular buffering efficiency and the size of the extracellular space.en
Type of ItemPeer-Reviewed Journal Publicationen
Type of ItemΔημοσίευση σε Περιοδικό με Κριτέςel
Licensehttp://creativecommons.org/licenses/by/4.0/en
Date of Item2015-10-19-
Date of Publication2011-
Bibliographic CitationG. Papoutsoglou, A. Anastasopoulou, G. Stavrakakis, W.P. Soutter and C. Balas, "In vivo Dynamic Imaging, in silico Modeling and Global Sensitivity Analysis for the Study and the Diagnosis of Epithelial Neoplasia" 33rd Annual International Conference of the IEEE EMBS Boston, Massachusetts USA, Aug. 30 - Sept. 3, 2011, doi: 10.1109/IEMBS.2011.6089905en

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