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Technical University of Crete
Technical University of Crete
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| URI | http://purl.tuc.gr/dl/dias/B568646D-B09F-4666-8E14-4B2EC0A11C70 | - |
| Identifier | http://www.sciencedirect.com/science/article/pii/S0167715203003390 | - |
| Identifier | https://doi.org/10.1016/j.spl.2003.06.008 | - |
| Language | en | - |
| Extent | 8 pages | en |
| Title | Large deviations for the empirical process of a symmetric measure: a lower bound | en |
| Creator | Daras Tryfonas | en |
| Creator | Δαρας Τρυφωνας | el |
| Publisher | Elsevier | en |
| Content Summary | Let {Xj}j=1∞ be a sequence of r.v.'s defined on a probability space (Ω,F,μ) and taking values in a compact metric space S, let Full-size image (<1 K) with X(n,ω) the point in SZ obtained by repeating (X1(ω),…,Xn(ω)) periodically on both sides and T the shift on SZ, be the empirical process associated to {Xj}j=1∞. We prove here that a large deviations result in the distributions of the empirical process w.r.t. a certain measure μ. This gives large deviations for the distributions of the empirical process with respect to a symmetric measure and also those associated to an exchangeable sequence of r.v.'s. | en |
| Type of Item | Peer-Reviewed Journal Publication | en |
| Type of Item | Δημοσίευση σε Περιοδικό με Κριτές | el |
| License | http://creativecommons.org/licenses/by/4.0/ | en |
| Date of Item | 2015-11-03 | - |
| Date of Publication | 2004 | - |
| Subject | Large deviations | en |
| Subject | Empirical process | en |
| Subject | Empirical measure | en |
| Subject | Symmetric measures | en |
| Subject | Exchangeable sequences | en |
| Bibliographic Citation | T. Daras, "Large deviations for the empirical process of a symmetric measure: a lower bound", Stat. Probab. Lett., vol. 66, no. 2, pp. 197-204, Jan. 2004. doi:10.1016/j.spl.2003.06.008 | en |
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