URI | http://purl.tuc.gr/dl/dias/3E0208CC-6B6C-4871-AD52-0D138E5D9D74 | - |
Identifier | http://ieeexplore.ieee.org/document/114047/ | - |
Identifier | https://doi.org/10.1109/TEST.1990.114047 | - |
Language | en | - |
Extent | 10 pages | en |
Title | An interactive environment for the transparent logic simulation and testing of integrated circuits | en |
Creator | Castrodale G. L. | en |
Creator | Dollas Apostolos | en |
Creator | Δολλας Αποστολος | el |
Creator | Krakow W. T. | en |
Publisher | Institute of Electrical and Electronics Engineers | en |
Content Summary | An interactive environment utilizing a knowledge-based system for the transparent testing of integrated circuits from simulation data has been developed. Unique features of this system are its modularity and its ease of expansion with new simulators and testers. The system uses the Omnitest language and a tester description language. The environment is fully operational and has been used to test several fabricated integrated circuits. An example illustrating the operation of the system is presented. | en |
Type of Item | Δημοσίευση σε Συνέδριο | el |
Type of Item | Conference Publication | en |
License | http://creativecommons.org/licenses/by/4.0/ | en |
Date of Item | 2015-11-17 | - |
Date of Publication | 1990 | - |
Subject | Automatic computers | en |
Subject | Automatic data processors | en |
Subject | Computer hardware | en |
Subject | Computing machines (Computers) | en |
Subject | Electronic brains | en |
Subject | Electronic calculating-machines | en |
Subject | Electronic computers | en |
Subject | Hardware, Computer | en |
Subject | computers | en |
Subject | automatic computers | en |
Subject | automatic data processors | en |
Subject | computer hardware | en |
Subject | computing machines computers | en |
Subject | electronic brains | en |
Subject | electronic calculating machines | en |
Subject | electronic computers | en |
Subject | hardware computer | en |
Bibliographic Citation | G. Castrodale, A. Dollas and W. Krakow, "An interactive environment for the transparent logic simulation and testing of integrated circuits," in International Test Conference, 1990, pp. 394-403. doi: 10.1109/TEST.1990.114047 | en |