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An interactive environment for the transparent logic simulation and testing of integrated circuits

Castrodale G. L., Dollas Apostolos, Krakow W. T.

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URIhttp://purl.tuc.gr/dl/dias/3E0208CC-6B6C-4871-AD52-0D138E5D9D74-
Identifierhttp://ieeexplore.ieee.org/document/114047/-
Identifierhttps://doi.org/10.1109/TEST.1990.114047-
Languageen-
Extent10 pagesen
TitleAn interactive environment for the transparent logic simulation and testing of integrated circuitsen
CreatorCastrodale G. L.en
CreatorDollas Apostolosen
CreatorΔολλας Αποστολοςel
CreatorKrakow W. T.en
PublisherInstitute of Electrical and Electronics Engineersen
Content SummaryAn interactive environment utilizing a knowledge-based system for the transparent testing of integrated circuits from simulation data has been developed. Unique features of this system are its modularity and its ease of expansion with new simulators and testers. The system uses the Omnitest language and a tester description language. The environment is fully operational and has been used to test several fabricated integrated circuits. An example illustrating the operation of the system is presented.en
Type of ItemΔημοσίευση σε Συνέδριοel
Type of ItemConference Publicationen
Licensehttp://creativecommons.org/licenses/by/4.0/en
Date of Item2015-11-17-
Date of Publication1990-
SubjectAutomatic computersen
SubjectAutomatic data processorsen
SubjectComputer hardwareen
SubjectComputing machines (Computers)en
SubjectElectronic brainsen
SubjectElectronic calculating-machinesen
SubjectElectronic computersen
SubjectHardware, Computeren
Subjectcomputersen
Subjectautomatic computersen
Subjectautomatic data processorsen
Subjectcomputer hardwareen
Subjectcomputing machines computersen
Subjectelectronic brainsen
Subjectelectronic calculating machinesen
Subjectelectronic computersen
Subjecthardware computeren
Bibliographic CitationG. Castrodale, A. Dollas and W. Krakow, "An interactive environment for the transparent logic simulation and testing of integrated circuits," in International Test Conference, 1990, pp. 394-403. doi: 10.1109/TEST.1990.114047en

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