Institutional Repository
Technical University of Crete
Technical University of Crete
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| URI: | http://purl.tuc.gr/dl/dias/F491B0D0-6DF7-4BD8-8BF3-D70FA9F0C812 | ||
| Year | 1987 | ||
| Type of Item | Peer-Reviewed Journal Publication | ||
| License |
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| Bibliographic Citation | M. Pilakouta, A. Neskakis, K. Papastaikoudis, A. A. Katsanos, H. Wenzl, and K. H. Klatt, "Analysis of hydrogen depth profiles in a Ta-Ti sandwich film by the 15N reaction method" J. Less Comm. Metals, vol. 130, pp. 525-528, Mar. 1987. doi:10.1016/0022-5088(87)90151-2 https://doi.org/10.1016/0022-5088(87)90151-2 | ||
| Appears in Collections |
The resonance at Full-size image (<1 K) in the reaction 1H(15N,αγ)12C has been employed as a powerful tool for the quantitative determination of hydrogen depth profiles in a thin film sandwich of tantalum and titanium on on a solid substrate. The hydrogen profiles have been investigated in vacuum in the temperature range between 25 °C and 400 °C. It is found that at 25 °C the hydrogen to metal ratios in the sandwich components tantalum and titanium are approximately 0.5 and 2 respectively.
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