Institutional Repository
Technical University of Crete
Technical University of Crete
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| URI | http://purl.tuc.gr/dl/dias/F491B0D0-6DF7-4BD8-8BF3-D70FA9F0C812 | - |
| Identifier | http://www.sciencedirect.com/science/article/pii/0022508887901512 | - |
| Identifier | https://doi.org/10.1016/0022-5088(87)90151-2 | - |
| Language | en | - |
| Extent | 4 pages | en |
| Title | Analysis of hydrogen depth profiles in a Ta-Ti sandwich film by the 15N reaction method | en |
| Creator | Katsanos Anastasios | en |
| Creator | Κατσανος Αναστασιος | el |
| Creator | M. Pilakouta | en |
| Creator | Neskakis, Apostolos | en |
| Creator | H. Wenzl | en |
| Creator | K. H. Klatt | en |
| Publisher | Elsevier | en |
| Content Summary | The resonance at Full-size image (<1 K) in the reaction 1H(15N,αγ)12C has been employed as a powerful tool for the quantitative determination of hydrogen depth profiles in a thin film sandwich of tantalum and titanium on on a solid substrate. The hydrogen profiles have been investigated in vacuum in the temperature range between 25 °C and 400 °C. It is found that at 25 °C the hydrogen to metal ratios in the sandwich components tantalum and titanium are approximately 0.5 and 2 respectively. | en |
| Type of Item | Peer-Reviewed Journal Publication | en |
| Type of Item | Δημοσίευση σε Περιοδικό με Κριτές | el |
| License | http://creativecommons.org/licenses/by/4.0/ | en |
| Date of Item | 2015-12-02 | - |
| Date of Publication | 1987 | - |
| Bibliographic Citation | M. Pilakouta, A. Neskakis, K. Papastaikoudis, A. A. Katsanos, H. Wenzl, and K. H. Klatt, "Analysis of hydrogen depth profiles in a Ta-Ti sandwich film by the 15N reaction method" J. Less Comm. Metals, vol. 130, pp. 525-528, Mar. 1987. doi:10.1016/0022-5088(87)90151-2 | en |
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