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An external beam technique for proton-induced X-ray emission analysis

Katsanos Anastasios, Xenoulis Alexander C., Hadjiantoniou A. , Fink Richard W.

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URIhttp://purl.tuc.gr/dl/dias/BE7DEB09-9F56-4BC9-BC4D-A851F5EEC6B9-
Identifierhttp://www.sciencedirect.com/science/article/pii/0029554X76902561-
Identifierhttps://doi.org/10.1016/0029-554X(76)90256-1 -
Languageen-
Extent6 pagesen
TitleAn external beam technique for proton-induced X-ray emission analysis en
CreatorKatsanos Anastasiosen
CreatorΚατσανος Αναστασιοςel
CreatorXenoulis Alexander C.en
CreatorHadjiantoniou A. en
CreatorFink Richard W. en
PublisherElsevieren
Content SummaryA method for proton irradiation of targets in free air is described. A 7.6 μm beryllium foil used as a proton exit window causes negligible energy loss for as low as 2 MeV protons and can withstand relatively high currents for extended periods of time without vacuum problems. Proton-induced X-rays from thin and thick samples are detected using Si(Li) and intrinsic Ge detectors A detailed comparison of X-ray spectra obtained both with external and internal bombardment, for a variety of samples, is presented and these results clearly demonstrate the superior performance of the external beam technique for elemental micro-analysis.en
Type of ItemPeer-Reviewed Journal Publicationen
Type of ItemΔημοσίευση σε Περιοδικό με Κριτέςel
Licensehttp://creativecommons.org/licenses/by/4.0/en
Date of Item2015-12-02-
Date of Publication1976-
SubjectX-ray emission analysisen
Bibliographic CitationA. Katsanos, A. Xenoulis, A. Hadjiantoniou and R. W. Fink, "An external beam technique for proton-induced X-ray emission analysis", Nucl. Instrum. Meth., vol. 137, no. 1, pp. 119-124, Aug. 1976. doi: 10.1016/0029-554X(76)90256-1 en

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