Institutional Repository
Technical University of Crete
Technical University of Crete
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| URI: | http://purl.tuc.gr/dl/dias/CA0573C2-C184-4D5B-9D5B-BCABCA106950 | ||
| Year | 1985 | ||
| Type of Item | Peer-Reviewed Journal Publication | ||
| License |
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| Bibliographic Citation | A. Hadjiantoniou, and A. A. Katsanos, "Exposure evaluation of dosimetric films by PIXE", Nucl. Instrum. Meth. Phys. Res. Sect. B, vol. 9, no. 3, pp. 306-310, Jun. 1985. doi:10.1016/0168-583X(85)90755-4 https://doi.org/10.1016/0168-583X(85)90755-4 | ||
| Appears in Collections |
The proton induced X-ray emission (PIXE) external beam method is used for the absolute determination of the fixed silver surface density on the fast and slow emulsion sides of Kodak Radiation Monitoring Type 2 films exposed to known gamma ray doses. The results are compared to those obtained by measuring optical densities. In the low dose range region doses as low as 1 mR can be accurately determined by the PIXE method. High exposures up to 800 R can be evaluated by direct measurements without the removal of the fast emulsion. The highest dose that can be measured by PIXE is only limited by the amount and grain size of the silver bromide on the slow emulsion side of the film.
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