Ιδρυματικό Αποθετήριο
Πολυτεχνείο Κρήτης
Πολυτεχνείο Κρήτης
EN
|
EL
| URI | http://purl.tuc.gr/dl/dias/CA0573C2-C184-4D5B-9D5B-BCABCA106950 | - |
| Αναγνωριστικό | http://www.sciencedirect.com/science/article/pii/0168583X85907554 | - |
| Αναγνωριστικό | https://doi.org/10.1016/0168-583X(85)90755-4 | - |
| Γλώσσα | en | - |
| Μέγεθος | 5 pages | en |
| Τίτλος | Exposure evaluation of dosimetric films by PIXE | en |
| Δημιουργός | Katsanos Anastasios | en |
| Δημιουργός | Κατσανος Αναστασιος | el |
| Δημιουργός | Hadjiantoniou, Alex | en |
| Εκδότης | Elsevier | en |
| Περίληψη | The proton induced X-ray emission (PIXE) external beam method is used for the absolute determination of the fixed silver surface density on the fast and slow emulsion sides of Kodak Radiation Monitoring Type 2 films exposed to known gamma ray doses. The results are compared to those obtained by measuring optical densities. In the low dose range region doses as low as 1 mR can be accurately determined by the PIXE method. High exposures up to 800 R can be evaluated by direct measurements without the removal of the fast emulsion. The highest dose that can be measured by PIXE is only limited by the amount and grain size of the silver bromide on the slow emulsion side of the film. | en |
| Τύπος | Peer-Reviewed Journal Publication | en |
| Τύπος | Δημοσίευση σε Περιοδικό με Κριτές | el |
| Άδεια Χρήσης | http://creativecommons.org/licenses/by/4.0/ | en |
| Ημερομηνία | 2015-12-02 | - |
| Ημερομηνία Δημοσίευσης | 1985 | - |
| Βιβλιογραφική Αναφορά | A. Hadjiantoniou, and A. A. Katsanos, "Exposure evaluation of dosimetric films by PIXE", Nucl. Instrum. Meth. Phys. Res. Sect. B, vol. 9, no. 3, pp. 306-310, Jun. 1985. doi:10.1016/0168-583X(85)90755-4 | en |
Copyright © DIAS 2013
