Ιδρυματικό Αποθετήριο
Πολυτεχνείο Κρήτης
Πολυτεχνείο Κρήτης
EN
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| URI: | http://purl.tuc.gr/dl/dias/5DB97484-DDF0-4D8B-9CEA-CD4D529420EE | ||
| Έτος | 1998 | ||
| Τύπος | Δημοσίευση σε Περιοδικό με Κριτές | ||
| Άδεια Χρήσης |
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| Βιβλιογραφική Αναφορά | V. Chatzisotiriou, I. Christofis, N. Dimitriou, C. Dre, N. Haralabidis, S. Karvelas, A. G. Karydas, D. Loukas, K. Misiakos, A. Pavlidis, V. Perdikatsis, V. Psycharis, S. Spirou, A. Terzis, R. Turchetta and E. Tsoi, "X-ray powder crystallography with vertex instrumentation", Nucl. Instrum. Meth. Phys. Res. Sect. A, vol. 418, no. 1, pp. 173-185, Nov. 1998. doi: 10.1016/S0168-9002(98)00731-1 https://doi.org/10.1016/S0168-9002(98)00731-1 | ||
| Εμφανίζεται στις Συλλογές |
An X-ray Diffractometer for Powder Crystallography is described along with experimental results and future plans. This is an intermediate instrument toward a long linear array system. Three channels of a silicon microstrip detector, are the detecting elements in the present instrument. Each detector channel is followed by a VLSI readout chain, which consists of a charge preamplifier with pulse shaping circuitry, a discriminator, and a 16-bit counter. Control and data acquisition is performed with a custom made PC readout card. A motorized goniometer scans the angle range of interest. Calibration of the system is done with reference samples and data which are captured with a one-channel conventional NaI detector.
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