Institutional Repository
Technical University of Crete
Technical University of Crete
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| URI: | http://purl.tuc.gr/dl/dias/6478F07C-E230-450A-A4CB-CC70418BFB21 | ||
| Year | 2018 | ||
| Type of Item | Master Thesis | ||
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| Bibliographic Citation | Aristeidis Nikolaou, "Characterization and modeling of high total ionizing dose effects and low frequency noise in standard CMOS technology", Master Thesis, School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece, 2018 https://doi.org/10.26233/heallink.tuc.77171 | ||
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