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Technical University of Crete
Technical University of Crete
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| URI | http://purl.tuc.gr/dl/dias/8828F177-C4C1-4FE2-8C51-0ED4BB2D6D06 | - |
| Identifier | https://doi.org/10.1109/MOCAST.2018.8376561 | - |
| Identifier | https://ieeexplore.ieee.org/document/8376561 | - |
| Language | en | - |
| Extent | 5 pages | en |
| Title | Extending a 65nm CMOS process design kit for high total ionizing dose effects | en |
| Creator | Nikolaou Aristeidis | en |
| Creator | Νικολαου Αριστειδης | el |
| Creator | Bucher Matthias | en |
| Creator | Bucher Matthias | el |
| Creator | Makris Nikolaos | en |
| Creator | Μακρης Νικολαος | el |
| Creator | Papadopoulou Alexia | en |
| Creator | Παπαδοπουλου Αλεξια | el |
| Creator | Chevas Loukas | en |
| Creator | Χεβας Λουκας | el |
| Creator | Borghello Giulio | en |
| Creator | Koch Henri D. | en |
| Creator | Kloukinas Kostas C. | en |
| Creator | Poikela Tuomas S. | en |
| Creator | Faccio Federico | en |
| Publisher | Institute of Electrical and Electronics Engineers | en |
| Content Summary | Standard CMOS Process Design Kits (PDKs) do not address degradation the technology incurs when exposed to high Total Ionizing Dose (TID). Front-end electronics for the High-Luminosity Large Hadron Collider are expected to be exposed up to ten-fold doses. Bulk CMOS at 65 nm is a strong contender for such electronics due to a favorable trade-off among cost, performance, and TID-sensitivity. The present paper presents the extension of a foundry-provided PDK to cover also high TID effects. TID experiments have been carried out up to 500 Mrad. The PDK is based on binned BSIM4 models, which are adapted to different TID levels. Hence, designers may choose among different TID levels for their designs, contributing importantly to radiation-hard design practice. | en |
| Type of Item | Πλήρης Δημοσίευση σε Συνέδριο | el |
| Type of Item | Conference Full Paper | en |
| License | http://creativecommons.org/licenses/by/4.0/ | en |
| Date of Item | 2019-09-06 | - |
| Date of Publication | 2018 | - |
| Subject | BSIM | en |
| Subject | Compact model | en |
| Subject | High-Luminosity Large Hadron Collider | en |
| Subject | Ionizing radiation | en |
| Subject | MOSFET | en |
| Subject | Radiation hardness | en |
| Subject | Total ionizing dose | en |
| Bibliographic Citation | A. Nikolaou, M. Bucher, N. Makris, A. Papadopoulou, L. Chevas, G. Borghello, H.D. Koch, K. Kloukinas, T.S. Poikela and F. Faccio, "Extending a 65nm CMOS process design kit for high total ionizing dose effects," in 7th International Conference on Modern Circuits and Systems Technologies, 2018, pp. 1-4. doi: 10.1109/MOCAST.2018.8376561 | en |
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