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Study of enclosed gate P-Type MOS field effect transistors – characterization and variability

Drakos Vissarios

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URI: http://purl.tuc.gr/dl/dias/8CFAF1A0-4292-4CDB-8C97-3FB93E9BC1BC
Year 2019
Type of Item Diploma Work
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Bibliographic Citation Vissarios Drakos, "Study of enclosed gate P-Type MOS field effect transistors – characterization and variability", Diploma Work, School of Electrical and Computer Engineering, Technical University of Crete, Chania, Greece, 2019 https://doi.org/10.26233/heallink.tuc.84072
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