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Low level lead determination after membrane complexation and TXRF analysis

Koulouridakis Pavlos, Domazos Efthimios A., Nikolakaki Smaragdi, Kallithrakas-Kontos Nikolaos

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Year 2004
Type of Item Peer-Reviewed Journal Publication
Bibliographic Citation P.E. Koulouridakis, E.A. Domazos, S.M. Galani-Nikolakaki, and N.G. Kallithrakas-Kontos, "Low level lead determination after membrane complexation and TXRF analysis," Microchim. Acta, vol. 146, no. 3, pp. 245-250, Apr. 2004. doi: 10.1007/s00604-004-0205-7
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New membranes containing a few micrograms of various complexing reagents in a Nafion® matrix were produced on the surface of quartz glasses (reflectors). The reflectors were immersed in standard water solutions containing various, very low concentrations of lead salts (1–50 ng mL−1). The reflectors were left in 5–500 mL solutions for many hours; when the equilibration stage was complete, they were cleaned with ultrapure water and left to dry. The stability (adhesion) of the membranes was tested. Analysis of the samples was performed by Total Reflection X-Ray Fluorescence and cross-evaluated by Atomic Absorption Spectrometry. A few ng mL−1 of the lead were determined. The effect of various experimental parameters (complexing agent, membrane composition, equilibrium time, sample volume etc.) was examined.